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[IEEE 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE) - Buzios, Rio de Janeiro, Brazil (2015.6.3-2015.6.5)] 2015 IEEE 24th International Symposium on Industrial Electronics (ISIE) - Inspecting surface mounted devices using k nearest neighbor and Multilayer Perceptron
de Mello, Alexandre R., Stemmer, Marcelo R.Year:
2015
Language:
english
DOI:
10.1109/isie.2015.7281599
File:
PDF, 1.65 MB
english, 2015