![](/img/cover-not-exists.png)
[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - Near optimal repair rate built-in redundancy analysis with very small hardware overhead
Lee, Woosung, Cho, Keewon, Kim, Jooyoung, Kang, SunghoYear:
2015
Language:
english
DOI:
10.1109/isqed.2015.7085465
File:
PDF, 221 KB
english, 2015