[IEEE 2014 IEEE 14th International Conference on...

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[IEEE 2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO) - Toronto, ON, Canada (2014.8.18-2014.8.21)] 14th IEEE International Conference on Nanotechnology - Cross-sectional imaging of C. elegans by SEM-CT using Environmental SEM for nanomanipulation

Nakajima, Masahiro, Takeuchi, Masaru, Hisamoto, Naoki, Fukuda, Toshio, Hasegawa, Yasuhisa, Qiang Huang,
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Year:
2014
Language:
english
DOI:
10.1109/nano.2014.6968153
File:
PDF, 653 KB
english, 2014
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