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[IEEE 2007 Non-Volatile Memory Technology Symposium - Albuquerque, NM (2007.11.10-2007.11.13)] 2007 Non-Volatile Memory Technology Symposium - Improvement of resistance switching characteristics in NiO films obtained from controlled Ni oxidation
Courtade, L., Turquat, C., Muller, C., Lisoni, J.G., Goux, L., Wouters, D.J.Year:
2007
Language:
english
DOI:
10.1109/nvmt.2007.4389934
File:
PDF, 488 KB
english, 2007