![](/img/cover-not-exists.png)
[IEEE 2006 Technology Management for the Global Future - PICMET 2006 Conference - Istanbul, Turkey (2006.07.8-2006.07.13)] 2006 Technology Management for the Global Future - PICMET 2006 Conference - Threat and Opportunity Analysis in Technological Development
Arman, Husam, Hodgson, Allan, Gindy, NabilYear:
2006
Language:
english
DOI:
10.1109/picmet.2006.296547
File:
PDF, 7.28 MB
english, 2006