[IEEE 2015 12th International Multi-Conference on Systems, Signals & Devices (SSD) - Mahdia, Tunisia (2015.3.16-2015.3.19)] 2015 IEEE 12th International Multi-Conference on Systems, Signals & Devices (SSD15) - Estimating the K-distribution parameters based on fractional negative moments
Chalabi, Izzeddine, Mezache, AmarYear:
2015
Language:
english
DOI:
10.1109/ssd.2015.7348114
File:
PDF, 842 KB
english, 2015