Atomic force microscopy and the mechanism of fatigue crack...

Atomic force microscopy and the mechanism of fatigue crack growth

M. Jono, A. Sugeta, Y. Uematsu
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Volume:
24
Year:
2001
Language:
english
Pages:
12
DOI:
10.1046/j.1460-2695.2001.00458.x
File:
PDF, 1.08 MB
english, 2001
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