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Dynamic-speckle profilometer for online measurements of coating thickness
Kamshilin, A A, Semenov, D V, Nippolainen, E, Miridonov, SVolume:
85
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/85/1/012021
Date:
October, 2007
File:
PDF, 561 KB
english, 2007