[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - The research on breakdown voltage of high voltage SOI LDMOS devices with shielding trench
Qiyu Liu,, Zhaoji Li,, Bo Zhang,, Jian Fang,Volume:
1
Year:
2001
Language:
english
DOI:
10.1109/icsict.2001.981446
File:
PDF, 204 KB
english, 2001