Plant quality vs. risk of parasitism: within-plant...

Plant quality vs. risk of parasitism: within-plant distribution and performance of the corn leaf aphid, Rhopalosiphum maidis

Wilfredo L. Gonzáles, Ernesto Gianoli, Hermann M. Niemeyer
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Volume:
3
Year:
2001
Language:
english
Pages:
5
DOI:
10.1046/j.1461-9563.2001.00084.x
File:
PDF, 72 KB
english, 2001
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