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[IEEE 2015 10th International Design & Test Symposium (IDT) - Dead Sea, Amman, Jordan (2015.12.14-2015.12.16)] 2015 10th International Design & Test Symposium (IDT) - A proposed methodology to improve UVM-based test generation and coverage closure
Fathy, Khaled, Salah, Khaled, Guindi, RafikYear:
2015
Language:
english
DOI:
10.1109/idt.2015.7396754
File:
PDF, 132 KB
english, 2015