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[IEEE ISCAS '98 1998 IEEE International Symposium on Circuits and Systems - Monterey, CA, USA (31 May-3 June 1998)] ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187) - Thermal testing on programmable logic devices
Lopez-Buedo, S., Garrido, J., Boemo, E.Volume:
2
Year:
1998
Language:
english
DOI:
10.1109/iscas.1998.706886
File:
PDF, 364 KB
english, 1998