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Light Activated Copper Defects in P-Type Silicon Studied by PCD
Yli-Koski, M, Väinölä, H, Haarahiltunen, A, Storgårds, J, Saarnilehto, E, Sinkkonen, JVolume:
T114
Language:
english
Journal:
Physica Scripta
DOI:
10.1088/0031-8949/2004/t114/016
Date:
January, 2004
File:
PDF, 89 KB
english, 2004