[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Low-cost phase noise testing of complex RF ICs using standard digital ATE
David-Grignot, Stephane, Azais, Florence, Latorre, Laurent, Lefevre, FrancoisYear:
2014
Language:
english
DOI:
10.1109/TEST.2014.7035301
File:
PDF, 611 KB
english, 2014