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[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Low-cost phase noise testing of complex RF ICs using standard digital ATE

David-Grignot, Stephane, Azais, Florence, Latorre, Laurent, Lefevre, Francois
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Year:
2014
Language:
english
DOI:
10.1109/TEST.2014.7035301
File:
PDF, 611 KB
english, 2014
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