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Reliability Analysis of Operating Systems and Software Stack for Embedded Systems
Santini, Thiago, Carro, Luigi, Rech Wagner, Flavio, Rech, PaoloYear:
2016
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2513384
File:
PDF, 1.04 MB
english, 2016