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[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Analysis of TFET and FinFET differential pairs with active load from 300K to 450K

Martino, Marcio D. V., Martino, Joao A., Agopian, Paula G. D.
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Year:
2016
Language:
english
DOI:
10.1109/ULIS.2016.7440099
File:
PDF, 311 KB
english, 2016
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