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[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - At-Speed Testing of Inter-Die Connections of 3D-SICs in the Presence of Shore Logic
Shibin, Konstantin, Chickermane, Vivek, Keller, Brion, Papameletis, Christos, Marinissen, Erik JanYear:
2015
Language:
english
DOI:
10.1109/ats.2015.21
File:
PDF, 557 KB
english, 2015