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[IEEE 2015 13th International Conference The Experience of...

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[IEEE 2015 13th International Conference The Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) - Lviv - Polyana, Ukraine (2015.2.24-2015.2.27)] The Experience of Designing and Application of CAD Systems in Microelectronics - Modelling time reliability indices of unsymmetrical hierarchical systems with Rayleigh distributed output elements

Sydor, Andriy, Teslyuk, Vasyl
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Year:
2015
Language:
english
DOI:
10.1109/cadsm.2015.7230894
File:
PDF, 225 KB
english, 2015
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