[IEEE 2005 42nd Design Automation Conference - Anaheim, CA, USA (2005.06.13-2005.06.17)] Proceedings. 42nd Design Automation Conference, 2005. - A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs
Topaloglu, R.O., Orailoglu, A.Year:
2005
Language:
english
DOI:
10.1109/dac.2005.193934
File:
PDF, 1.02 MB
english, 2005