![](/img/cover-not-exists.png)
[IEEE 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - Estoril, Portugal (2015.11.25-2015.11.27)] 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - About the functional test of permanent faults in distributed systems
Vaskova, A., Portela-Garcia, M., Lopez-Ongil, C., Sanchez, E., Reorda, M. SonzaYear:
2015
Language:
english
DOI:
10.1109/dcis.2015.7388571
File:
PDF, 827 KB
english, 2015