Band Offset Characterization of the Atomic Layer Deposited Aluminum Oxide on m-Plane Indium Nitride
Jia, Ye, Wallace, Joshua S., Qin, Yueling, Gardella, Joseph A., Dabiran, Amir M., Singisetti, UttamVolume:
45
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-4175-9
Date:
April, 2016
File:
PDF, 1.31 MB
english, 2016