![](/img/cover-not-exists.png)
Study of amorphous Cu–Te–Si thin films showing high thermal stability for application as a cation supply layer in conductive bridge random access memory devices
Devulder, Wouter, Opsomer, Karl, Minjauw, Matthias M., Meersschaut, Johan, Jurczak, Malgorzata, Goux, Ludovic, Detavernier, ChristopheVolume:
6
Year:
2016
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/C6RA04064K
File:
PDF, 3.59 MB
english, 2016