Validation of nuclear reaction models relevant to cosmic-ray neutron induced single-event effects in microelectronics
Abe, Shin-ichiro, Watanabe, Yukinobu, Hirayama, Shusuke, Sano, Nobuyuki, Tosaka, Yoshiharu, Tsutsui, Masafumi, Furuta, Hiroshi, Imamura, TakeshiVolume:
312
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/312/6/062004
Date:
September, 2011
File:
PDF, 998 KB
english, 2011