Growth and dielectric characterisation of large grain...

IOP Conference Series Materials Science and Engineering 2010 / 02 Vol. 8

Growth and dielectric characterisation of large grain BiFeO 3 thin films on amorphous SiO 2 substrates

Vorobiev, A, Martirosyan, N, Eriksson, S G, Gevorgian, S
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Volume:
8
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/8/1/012001
Date:
February, 2010
File:
PDF, 1.14 MB
english, 2010
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