Transmission electron microscopy analysis of FeAs...

Transmission electron microscopy analysis of FeAs precipitates formed in GaAs/AlGaAs heterostructures

Katcki, J., Shiojiri, M., Isshiki, T., Nishio, K., Yabuuchi, Y., Jin-Phillipp, N. Y.
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Volume:
47
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/oxfordjournals.jmicro.a023630
Date:
January, 1998
File:
PDF, 5.81 MB
english, 1998
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