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[IEEE 2016 IEEE International Solid-State Circuits Conference (ISSCC) - San Francisco, CA, USA (2016.1.31-2016.2.4)] 2016 IEEE International Solid-State Circuits Conference (ISSCC) - 6.8 A 1.5V 33Mpixel 3D-stacked CMOS image sensor with negative substrate bias
Liu, Charles Chih-Min, Mhala, Manoj M., Chang, Chin-Hao, Tu, Honyih, Chou, Po-Sheng, Chao, Calvin, Hsueh, Fu-LungYear:
2016
Language:
english
DOI:
10.1109/ISSCC.2016.7417938
File:
PDF, 2.60 MB
english, 2016