[IEEE 2015 27th International Conference on Microelectronics (ICM) - Casablanca, Morocco (2015.12.20-2015.12.23)] 2015 27th International Conference on Microelectronics (ICM) - A comparison of multi-resolution and multi-orientation for breast cancer diagnosis in the full-field digital mammogram
Addioui, Abdelaziz, Benabbou, Faouzia, El Filali, Sanaa, El Aroussi, MohamedYear:
2015
Language:
english
DOI:
10.1109/icm.2015.7438037
File:
PDF, 1.05 MB
english, 2015