[IEEE 2015 27th International Conference on...

  • Main
  • [IEEE 2015 27th International...

[IEEE 2015 27th International Conference on Microelectronics (ICM) - Casablanca, Morocco (2015.12.20-2015.12.23)] 2015 27th International Conference on Microelectronics (ICM) - A comparison of multi-resolution and multi-orientation for breast cancer diagnosis in the full-field digital mammogram

Addioui, Abdelaziz, Benabbou, Faouzia, El Filali, Sanaa, El Aroussi, Mohamed
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/icm.2015.7438037
File:
PDF, 1.05 MB
english, 2015
Conversion to is in progress
Conversion to is failed