![](/img/cover-not-exists.png)
Measuring and specifying combinatorial coverage of test input configurations
Kuhn, D. Richard, Kacker, Raghu N., Lei, YuVolume:
12
Language:
english
Journal:
Innovations in Systems and Software Engineering
DOI:
10.1007/s11334-015-0266-2
Date:
December, 2016
File:
PDF, 1.11 MB
english, 2016