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Heterodyne Interferometer for the Metrological Assurance of the Devices Measuring Physical Properties of Nanostructured Materials
Kuznetsov, A.P., Kazieva, T.V., Gubskiy, K.L., Maslenikov, I.I., Reshetov, V.N.Volume:
72
Year:
2015
Language:
english
Journal:
Physics Procedia
DOI:
10.1016/j.phpro.2015.09.059
File:
PDF, 284 KB
english, 2015