Charging characteristics of Si nanocrystals embedded within SiO 2 in the presence of near-interface oxide traps
Ioannou-Sougleridis, V, Nassiopoulou, A GVolume:
10
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/10/1/010
Date:
January, 2005
File:
PDF, 111 KB
english, 2005