Electrical characterization of MOS structures with...

Journal of Physics Conference Series 2010 / 11 Vol. 253

Electrical characterization of MOS structures with self-organized three-layer gate dielectric containing Si nanocrystals

Nedev, N, Nesheva, D, Curiel, M, Manolov, E, Petrov, I, Valdez, B, Bineva, I
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
253
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/253/1/012034
Date:
November, 2010
File:
PDF, 798 KB
english, 2010
Conversion to is in progress
Conversion to is failed