Unsupervised defect segmentation of patterned materials under NIR illumination
Millán, María S, Escofet, Jaume, Ralló, MiquelVolume:
274
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/274/1/012044
Date:
January, 2011
File:
PDF, 973 KB
english, 2011