[IEEE 2015 IEEE Applied Imagery Pattern Recognition...

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[IEEE 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2015.10.13-2015.10.15)] 2015 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Unsupervised classification of SAR imagery using polarimetric decomposition to preserve scattering characteristics

Marapareddy, Ramakalavathi, Aanstoos, James V., Younan, Nicolas H.
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Year:
2015
Language:
english
DOI:
10.1109/aipr.2015.7444532
File:
PDF, 750 KB
english, 2015
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