[IEEE 2014 84th ARFTG Microwave Measurement Conference - Boulder, CO, USA (2014.12.4-2014.12.5)] 84th ARFTG Microwave Measurement Conference - Measurement uncertainty in waveguide VNA calibrated by offset short calibration with oversized waveguide aperture at sub-millimeter wave frequency
Horibe, Masahiro, Kishikawa, RyokoYear:
2014
Language:
english
DOI:
10.1109/arftg.2014.7013420
File:
PDF, 1.64 MB
english, 2014