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[IEEE 2015 IEEE 28th Canadian Conference on Electrical and Computer Engineering (CCECE) - Halifax, NS, Canada (2015.5.3-2015.5.6)] 2015 IEEE 28th Canadian Conference on Electrical and Computer Engineering (CCECE) - A self-healing technique using ZTC biasing for PVT variations compensation in 65nm CMOS technology
Nateghi, Hamidreza, El-Sankary, KamalYear:
2015
Language:
english
DOI:
10.1109/ccece.2015.7129173
File:
PDF, 389 KB
english, 2015