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[IEEE 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP) - Ann Arbor, MI, USA (2015.10.18-2015.10.21)] 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Effect of the processing method on the electrical behavior of silicon nitride / epoxy nanocomposites
Alhabill, F. N., Andritsch, T., Vaughan, A. S.Year:
2015
Language:
english
DOI:
10.1109/ceidp.2015.7352133
File:
PDF, 1009 KB
english, 2015