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[IEEE 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2014.6.1-2014.6.5)] 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - BTI-induced aging under random stress waveforms: Modeling, simulation and silicon validation
Sutaria, Ketul, Ramkumar, Athul, Zhu, Rongjun, Rajveev, Renju, Ma, Yao, Cao, YuYear:
2014
Language:
english
DOI:
10.1109/dac.2014.6881530
File:
PDF, 1.10 MB
english, 2014