[IEEE Comput. Soc 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Albuquerque, NM, USA (1-3 Nov. 1999)] Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) - Power characterization of LFSRs
Brazzarola, M., Fummi, F.Year:
1999
Language:
english
DOI:
10.1109/dftvs.1999.802879
File:
PDF, 194 KB
english, 1999