[IEEE Conference Record of the 1998 IEEE International...

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[IEEE Conference Record of the 1998 IEEE International Symposium on Electrical Insulation - Arlington, VA, USA (7-10 June 1998)] Conference Record of the 1998 IEEE International Symposium on Electrical Insulation (Cat. No.98CH36239) - Measurements of statistical lag time of breakdown in thin amorphous layers of SiO/sub 2/

Vainer, B.G., Kupershtokh, A.L.
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Volume:
1
Year:
1998
Language:
english
DOI:
10.1109/elinsl.1998.704689
File:
PDF, 385 KB
english, 1998
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