[IEEE 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Santa Clara, CA, USA (2015.3.15-2015.3.21)] 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Gb/s USB: RFI risk analysis and test methodologies
Davuluri, Pujitha, Chen, Chung-hao, Chen, Kuan-yu, Gantner, EricYear:
2015
Language:
english
DOI:
10.1109/emcsi.2015.7107663
File:
PDF, 894 KB
english, 2015