[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - The influence of strong electric field on the interface in the Al-SiO/sub 2/-n-Si Auger transistor
Baranchuk, S.I., Kalganov, V.D., Mileshkina, N.V., Ostroumova, E.V., Rogachev, A.A.Volume:
1
Year:
1999
Language:
english
DOI:
10.1109/icmel.2000.840544
File:
PDF, 386 KB
english, 1999