[IEEE 2007 International Conference on Wavelet Analysis and Pattern Recognition - Beijing, China (2007.11.2-2007.11.4)] 2007 International Conference on Wavelet Analysis and Pattern Recognition - Critical point recognition for vision-based coverage of unknown environments
Yi-An Cui,, Zi-Xing Cai,, Lu Wang,Year:
2007
Language:
english
DOI:
10.1109/icwapr.2007.4421640
File:
PDF, 545 KB
english, 2007