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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Modeling resonance effects in the radiated emissions from a nonlinear system
Jerse, T.A.Volume:
1
Year:
2004
Language:
english
DOI:
10.1109/isemc.2004.1350036
File:
PDF, 239 KB
english, 2004