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[IEEE 2016 IEEE International Solid-State Circuits Conference (ISSCC) - San Francisco, CA, USA (2016.1.31-2016.2.4)] 2016 IEEE International Solid-State Circuits Conference (ISSCC) - 8.7 Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45nm smart-card chips
Karpinskyy, Bohdan, Lee, Yongki, Choi, Yunhyeok, Kim, Yongsoo, Noh, Mijung, Lee, SanghyunYear:
2016
Language:
english
DOI:
10.1109/isscc.2016.7417955
File:
PDF, 360 KB
english, 2016