[IEEE 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop (KAM 2008 Workshop) - Wuhan, China (2008.12.21-2008.12.22)] 2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop - Statistical Process Control Based on Multi-scale Wavelets Analysis
Rong-zhen, Shi, Fei, LiuYear:
2008
Language:
english
DOI:
10.1109/kamw.2008.4810443
File:
PDF, 89 KB
english, 2008