![](/img/cover-not-exists.png)
[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - Single event effects in an analog SOI transconductor: a case study
Viale, Carlos, Petrashin, Pablo, Toledo, Luis, Lancioni, Walter, Vazquez, CarlosYear:
2015
Language:
english
DOI:
10.1109/latw.2015.7102408
File:
PDF, 289 KB
english, 2015