[IEEE 2015 16th Latin-American Test Symposium (LATS) -...

  • Main
  • [IEEE 2015 16th Latin-American Test...

[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - Single event effects in an analog SOI transconductor: a case study

Viale, Carlos, Petrashin, Pablo, Toledo, Luis, Lancioni, Walter, Vazquez, Carlos
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/latw.2015.7102408
File:
PDF, 289 KB
english, 2015
Conversion to is in progress
Conversion to is failed