![](/img/cover-not-exists.png)
[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - The LHC test string: results from run 2
Saban, R., Blanco-Vinuela, E., Bordry, F., Bottura, L., Bozzini, D., Calzas-Rodriguez, C., Carlier, E., Denz, R., Granata, V., Horzog, R., King, Q., Milani, D., Puccio, B., Rodriguez-Mateos, F., SchmiVolume:
3
Year:
2003
Language:
english
DOI:
10.1109/pac.2003.1288731
File:
PDF, 213 KB
english, 2003