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[IEEE 2003 Particle Accelerator Conference - Portland, OR, USA (12-16 May 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Electron-beam size measurement with a beam profile monitor using Fresnel zone plates
Nakamura, N., Sakai, H., Iida, K., Shinoe, K., Takaki, H., Hayano, H., Nomura, M., Kamiya, Y., Koseki, T., Aoki, N., Nakayama, K.Year:
2003
Language:
english
DOI:
10.1109/pac.2003.1288968
File:
PDF, 210 KB
english, 2003