[IEEE 2015 20th International Conference on Process Control (PC) - Strbske Pleso, Slovakia (2015.6.9-2015.6.12)] 2015 20th International Conference on Process Control (PC) - System identification and stochastic estimation of dielectric properties of a spherical particle using AC-induced electro-rotation
Benhal, Prateek, Chase, J.G.Year:
2015
Language:
english
DOI:
10.1109/pc.2015.7169985
File:
PDF, 787 KB
english, 2015