[IEEE 2015 Annual Reliability and Maintainability Symposium (RAMS) - Palm Harbor, FL, USA (2015.1.26-2015.1.29)] 2015 Annual Reliability and Maintainability Symposium (RAMS) - Usage based predictive transistor aging model to optimize test limits on IO circuits
Mendes, James, Daniel, AbishaiYear:
2015
Language:
english
DOI:
10.1109/rams.2015.7105119
File:
PDF, 437 KB
english, 2015